The atomic force microscope (AFM) and scanning probe microscopy (SPM) are powerful tools used in the field of nanotechnology to study and manipulate materials at the atomic level. In a recent article on AZoNano, experts discussed the technology and history behind AFM and SPM.
AFM works by scanning a sharp tip over a surface at a very close distance, detecting the forces between the tip and the surface to create a detailed image of the material’s surface features. SPM, on the other hand, uses a tip to map the surface topography by measuring the forces between the tip and the sample.
The history of AFM dates back to the 1980s when Gerd Binnig and Heinrich Rohrer invented the first AFM, which revolutionized the field of nanotechnology by allowing researchers to see and manipulate individual atoms and molecules. Since then, AFM and SPM have become essential tools in various fields such as materials science, biology, and medicine.
Experts highlighted the importance of understanding the underlying principles of AFM and SPM to fully utilize their capabilities and unlock new possibilities in research and development. They emphasized the need for continuous innovation and collaboration to push the boundaries of nanotechnology and drive scientific advancements.
Overall, the article provided insights into the technology and history behind AFM and SPM, showcasing their significance in advancing the field of nanotechnology. As researchers continue to explore new applications and techniques, AFM and SPM will remain crucial tools in studying and manipulating materials at the atomic level.
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